| Record ID | marc_loc_2016/BooksAll.2016.part29.utf8:168726395:1048 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part29.utf8:168726395:1048?format=raw |
LEADER: 01048cam a22002654a 4500
001 2002005287
003 DLC
005 20040621201743.0
008 020403s2003 njua b 001 0 eng
010 $a 2002005287
020 $a047139761X (acid-free paper)
040 $aDLC$cDLC$dDLC
042 $apcc
050 00 $aTA169$b.K86 2003
082 00 $a620/.00452$221
100 1 $aKuo, Way,$d1951-
245 10 $aOptimal reliability modeling :$bprinciples and applications /$cWay Kuo, Ming J. Zuo.
260 $aHoboken, N.J. :$bJohn Wiley & Sons,$cc2003.
300 $axvi, 544 p. :$bill. ;$c24 cm.
504 $aIncludes bibliographical references (p. 527-538) and index.
650 0 $aReliability (Engineering)$xMathematical models.
700 1 $aZuo, Ming J.
856 42 $3Contributor biographical information$uhttp://www.loc.gov/catdir/bios/wiley044/2002005287.html
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/description/wiley037/2002005287.html
856 41 $3Table of contents$uhttp://www.loc.gov/catdir/toc/wiley031/2002005287.html